AR Full Frame Inspection Lens
Ultra-Low Distortion Optics for Critical Imaging Tasks
Key Features:
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Full-Frame Coverage – Supports 35mm sensor format (43.3mm image circle) with edge-to-edge clarity
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Advanced AR Coating – <0.3% reflectivity across 400-900nm for superior light transmission
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Precision Distortion Control – <0.05% barrel/pincushion distortion for metrology-grade accuracy
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Industrial Durability – Stainless steel barrel with IP67 sealing (dust/waterproof)
Technical Specifications:
| Parameter | Specification |
|---|---|
| Focal Length | 35mm / 50mm / 90mm (custom options) |
| Aperture | f/2.0 – f/22 with clickless iris |
| Resolution | 100 lp/mm at >70% contrast |
| Working Distance | 150mm – ∞ (adjustable) |
Applications:
✔ High-resolution semiconductor inspection
✔ Aerospace component measurement
✔ Biomedical imaging (e.g., histopathology)
✔ Fine art/document digitization
Customization Options:
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Coating Variants: UV (250-400nm) or NIR (900-1600nm) optimized
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Mounts: Canon EF, Nikon F, or proprietary OEM interfaces
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Focus Lock: Mechanical locking ring for vibration-prone environments
Quality Assurance:
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Tested per ISO 12233 (MTF/SFR) and IEC 60068-2 (environmental stress)
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Includes individual test certificate with MTF charts
